PROCEDE DE CODAGE D'INFORMATIONS ET DISPOSITIF ET PROCEDES D'EVALUATION DES INFORMATIONS CODEES
| N° de brevet: |
EP1567976 (A1) |
| Date de publication: |
2005-08-31 |
| Inventeur(s): |
MENNICKEN GUIDO [DE];VEREECKEN HARRY [DE]; |
| Demandeur(s): |
KERNFORSCHUNGSANLAGE JUELICH [DE]; |
| Classification: |
G06K7/12;G06K19/06; |
| N° de demande: |
EP20030757706 20031009 |
| Numéro(s) de priorité: |
WO2003DE03353 20031009;DE20021052628 20021111 |
The present invention relates to a nanocrystalline metallic material, particularly to nano-twin copper material with ultrahigh strength and high electrical conductivity and its preparation method. High-purity polycrystalline Cu material with a microstructure of roughly equiaxed submicron-sized grains (300-1000 nm) has been produced by pulsed electrodeposition technique, by which high density of grown-in twins with nano-scale twin spacing were induced in the grains. Inside each grain, there are high densities of grown-in twin lamellae. The twin lamellae with the same orientations are inter-parallel, and the twin spacing ranges from several nanometers to 100 nm with a length of 100-500 nm. This invented Cu material has a more excellent performance than existing ones. The tensile yield strength and ultimate strength of the present Cu material at room-temperature can be as high as 900 MPa and 1086 MPa, respectively, and such a high tensile strength cannot be achieved for Cu materials with the same chemical composition prepared by any traditional methods. Meanwhile, the present Cu sample also keeps a good electrical conductivity, for example, the room-temperature resistivity is (1.75+/-0.02) x 10 -8 OMEGA .m, corresponding to 96% IACS, which is close to that of conventional coarse-grained Cu. <IMAGE>
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